ESD investigations of multiwalled carbon nanotubes

IEEE Transactions on Device and Materials Reliability

Volumn 14, Issue 1, 2014, Pages 555-563

  Shrivastava, Mayank ^a   Kulshrestha, Neha ^b,c   Gossner, Harald ^d  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^c NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

^d INTEL CORPORATION   (United States)

Author keywords

Arrhenius behavior and graphene; carbon nanotubes; CNT; electrostatic discharge (ESD); high field transport; multiwalled carbon nanotubes (MWCNT); pulsed technique; quantum conductance

Indexed keywords

CARBON NANOTUBES; ELECTROSTATIC DISCHARGE; MULTIWALLED CARBON NANOTUBES (MWCN);

ARRHENIUS BEHAVIORS; CNT; HIGH FIELD TRANSPORT; PULSED TECHNIQUE; QUANTUM CONDUCTANCE;

ELECTROSTATIC DEVICES;

EID: 84898480825     PISSN: 15304388     EISSN: 15582574     Source Type: Journal    
DOI: 10.1109/TDMR.2013.2288362     Document Type: Article

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