SCOPUS 정보 검색 플랫폼

Volumn 99, Issue 7, 2011, Pages

High temperature measurements of metal contacts on epitaxial graphene

(9) Nagareddy, V K a Nikitina, I P a Gaskill, D K b Tedesco, J L b Myers Ward, R L b Eddy, C R b Goss, J P a Wright, N G a Horsfall, A B a

a NEWCASTLE UNIVERSITY (United Kingdom)

b NAVAL RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITED METAL; DIFFUSION ENERGY; ELECTRICAL CHARACTERISTIC; EPITAXIAL GRAPHENE; HIGH TEMPERATURE MEASUREMENT; METAL CONTACTS; RESISTANCE PARAMETERS;

BINDING ENERGY; EPITAXIAL GROWTH; GRAPHENE; HIGH TEMPERATURE APPLICATIONS; METALS; SILICON CARBIDE; TEMPERATURE MEASUREMENT; WORK FUNCTION;

SEMICONDUCTING SILICON COMPOUNDS;

EID: 80052101969 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3627167 Document Type: Article

Times cited : (37)

References (23)

1
- 67649225738
- 10.1126/science.1158877
- A. K. Geim, Science 324, 1530 (2009). 10.1126/science.1158877
- (2009) Science , vol.324 , pp. 1530
- Geim, A.K.¹

2
- 34548388792
- Detection of individual gas molecules adsorbed on graphene
- DOI 10.1038/nmat1967, PII NMAT1967
- F. Schedin, A. K. Geim, S. V. Morozov, E. W. Hill, P. Blake, M. I. Katsnelson, and K. S. Novoselov, Nature Mater. 6, 652 (2007). 10.1038/nmat1967 (Pubitemid 47359547)
- (2007) Nature Materials , vol.6 , Issue.9 , pp. 652-655
- Schedin, F.¹ Geim, A.K.² Morozov, S.V.³ Hill, E.W.⁴ Blake, P.⁵ Katsnelson, M.I.⁶ Novoselov, K.S.⁷

3
- 44049095735
- Higherature quenching of electrical resistance in graphene interconnects
- DOI 10.1063/1.2927371
- Q. Shao, G. Liu, D. Teweldebrhan, and A. A. Balandin, Appl. Phys. Lett. 92, 202108 (2008). 10.1063/1.2927371 (Pubitemid 351713451)
- (2008) Applied Physics Letters , vol.92 , Issue.19 , pp. 192117
- Shao, Q.¹ Liu, G.² Teweldebrhan, D.³ Balandin, A.A.⁴

4
- 75749109747
- 10.1063/1.3290248
- A. Venugopal, L. Colombo, and E. M. Vogel, Appl. Phys. Lett. 96, 013512 (2010). 10.1063/1.3290248
- (2010) Appl. Phys. Lett. , vol.96 , pp. 013512
- Venugopal, A.¹ Colombo, L.² Vogel, E.M.³

5
- 77149151250
- 10.1149/1.3119535
- D. K. Gaskill, G. G. Jernigan, P. M. Campbell, J. L. Tedesco, J. C. Culbertson, B. L. VanMil, R. L. Myers-Ward, Jr. , C. R. Eddy, J. Moon, D. Curtis, M. Hu, D. Wong, C. McGuire, J. A. Robinson, M. A. Fanton, J. P. Stitt, D. Snyder, X. Wang, and E. Frantz, ECS Trans. 19, 117 (2009). 10.1149/1.3119535
- (2009) ECS Trans. , vol.19 , pp. 117
- Gaskill, D.K.¹ Jernigan, G.G.² Campbell, P.M.³ Tedesco, J.L.⁴ Culbertson, J.C.⁵ Vanmil, B.L.⁶ Myers-Ward Jr., R.L.⁷ Eddy, C.R.⁸ Moon, J.⁹ Curtis, D.¹⁰ Hu, M.¹¹ Wong, D.¹² McGuire, C.¹³ Robinson, J.A.¹⁴ Fanton, M.A.¹⁵ Stitt, J.P.¹⁶ Snyder, D.¹⁷ Wang, X.¹⁸ Frantz, E.¹⁹

6
- 34648825700
- Electronic structure of epitaxial graphene layers on SiC: Effect of the substrate
- DOI 10.1103/PhysRevLett.99.126805
- F. Varchon, R. Feng, J. Hass, X. Li, B. N. Nguyen, C. Naud, P. Mallet, J. Y. Veuillen, C. Berger, E. H. Conrad, and L. Magaud, Phys. Rev. Lett. 99, 126805 (2007). 10.1103/PhysRevLett.99.126805 (Pubitemid 47462648)
- (2007) Physical Review Letters , vol.99 , Issue.12 , pp. 126805
- Varchon, F.¹ Feng, R.² Hass, J.³ Li, X.⁴ Nguyen, B.N.⁵ Naud, C.⁶ Mallet, P.⁷ Veuillen, J.-Y.⁸ Berger, C.⁹ Conrad, E.H.¹⁰ Magaud, L.¹¹

7
- 78449299206
- 10.1021/nl102824h
- P. Avouris, Nano Lett. 10, 4285 (2010). 10.1021/nl102824h
- (2010) Nano Lett. , vol.10 , pp. 4285
- Avouris, P.¹

8
- 70349653537
- 10.1063/1.3224887
- J. L. Tedesco, B. L. VanMil, R. L. Myers-Ward, J. M. McCrate, S. A. Kitt, P. M. Campbell, G. G. Jernigan, J. C. Culbertson, C. R. Eddy, and D. K. Gaskill, Appl. Phys. Lett. 95, 122102 (2009). 10.1063/1.3224887
- (2009) Appl. Phys. Lett. , vol.95 , pp. 122102
- Tedesco, J.L.¹ Vanmil, B.L.² Myers-Ward, R.L.³ McCrate, J.M.⁴ Kitt, S.A.⁵ Campbell, P.M.⁶ Jernigan, G.G.⁷ Culbertson, J.C.⁸ Eddy, C.R.⁹ Gaskill, D.K.¹⁰

9
- 0004071496
- (Wiley, New Jersey)
- D. K. Schroder, Semiconductor Material and Device Characterization (Wiley, New Jersey, 2006).
- (2006) Semiconductor Material and Device Characterization
- Schroder, D.K.¹

10
- 33847762932
- Spatially resolved raman spectroscopy of single- and few-layer graphene
- DOI 10.1021/nl061702a
- D. Graf, F. Molitor, K. Ensslin, C. Stampfer, A. Jungen, C. Hierold, and L. Wirtz, Nano Lett. 7, 238 (2007). 10.1021/nl061702a (Pubitemid 46383577)
- (2007) Nano Letters , vol.7 , Issue.2 , pp. 238-242
- Graf, D.¹ Molitor, F.² Ensslin, K.³ Stampfer, C.⁴ Jungen, A.⁵ Hierold, C.⁶ Wirtz, L.⁷

11
- 77958023479
- 10.1063/1.3491804
- K. Nagashio, T. Nishimura, K. Kita, and A. Toriumi, Appl. Phys. Lett. 97, 143514 (2010). 10.1063/1.3491804
- (2010) Appl. Phys. Lett. , vol.97 , pp. 143514
- Nagashio, K.¹ Nishimura, T.² Kita, K.³ Toriumi, A.⁴

12
- 77955912439
- 10.1021/jp103445v
- H. Valencia, A. Gil, and G. Frapper, J. Phys. Chem. C 114, 14141 (2010). 10.1021/jp103445v
- (2010) J. Phys. Chem. C , vol.114 , pp. 14141
- Valencia, H.¹ Gil, A.² Frapper, G.³

13
- 48249135493
- 10.1103/PhysRevLett.101.026803
- G. Giovannetti, P. A. Khomyakov, G. Brocks, V. M. Karpan, J. Brink, and P. J. Kelly, Phys. Rev. Lett. 101, 026803 (2008). 10.1103/PhysRevLett.101.026803
- (2008) Phys. Rev. Lett. , vol.101 , pp. 026803
- Giovannetti, G.¹ Khomyakov, P.A.² Brocks, G.³ Karpan, V.M.⁴ Brink, J.⁵ Kelly, P.J.⁶

14
- 77957720461
- 10.1103/PhysRevB.82.125407
- H. Pinto, R. Jones, J. P. Goss, and P. R. Briddon, Phys. Rev. B. 82, 125407 (2010). 10.1103/PhysRevB.82.125407
- (2010) Phys. Rev. B. , vol.82 , pp. 125407
- Pinto, H.¹ Jones, R.² Goss, J.P.³ Briddon, P.R.⁴

15
- 79955428325
- 10.1063/1.3536670
- W. X. Wang, S. H. Liang, T. Yu, D. H. Li, Y. B. Li, and X. F. Han, J. Appl. Phys. 109, 07C501 (2011). 10.1063/1.3536670
- (2011) J. Appl. Phys. , vol.109
- Wang, W.X.¹ Liang, S.H.² Yu, T.³ Li, D.H.⁴ Li, Y.B.⁵ Han, X.F.⁶

16
- 78649551873
- 10.1021/jp106188w
- S. Entani, S. Sakai, Y. Matsumoto, H. Naramoto, T. Hao, and Y. Maeda, J. Phys. Chem. C 114, 20042 (2010). 10.1021/jp106188w
- (2010) J. Phys. Chem. C , vol.114 , pp. 20042
- Entani, S.¹ Sakai, S.² Matsumoto, Y.³ Naramoto, H.⁴ Hao, T.⁵ Maeda, Y.⁶

17
- 61649089243
- 10.1021/nl802996s
- I. Gierz, C. Riedl, U. Starke, C. R. Ast, and K. Kern, Nano Lett. 8, 4603 (2008). 10.1021/nl802996s
- (2008) Nano Lett. , vol.8 , pp. 4603
- Gierz, I.¹ Riedl, C.² Starke, U.³ Ast, C.R.⁴ Kern, K.⁵

18
- 77955737752
- 10.1063/1.3471396
- Y. Ren, S. Chen, W. Cai, Y. Zhu, C. Zhu, and R. S. Ruoff, Appl. Phys. Lett. 97, 053107 (2010). 10.1063/1.3471396
- (2010) Appl. Phys. Lett. , vol.97 , pp. 053107
- Ren, Y.¹ Chen, S.² Cai, W.³ Zhu, Y.⁴ Zhu, C.⁵ Ruoff, R.S.⁶

19
- 70349484255
- 10.1063/1.3231440
- Z. Klusek, P. Dabrowski, P. Kowalczyk, W. Kozlowski, W. Olejniczak, P. Blake, M. Szybowicz, and T. Runka, Appl. Phys. Lett. 95, 113114 (2009). 10.1063/1.3231440
- (2009) Appl. Phys. Lett. , vol.95 , pp. 113114
- Klusek, Z.¹ Dabrowski, P.² Kowalczyk, P.³ Kozlowski, W.⁴ Olejniczak, W.⁵ Blake, P.⁶ Szybowicz, M.⁷ Runka, T.⁸

20
- 79952445612
- 10.1038/nnano.2011.6
- F. Xia, V. Perebeinos, Y. M. Lin, Y. Wu, and P. Avouris, Nat. Nanotechnol. 6, 179 (2011). 10.1038/nnano.2011.6
- (2011) Nat. Nanotechnol. , vol.6 , pp. 179
- Xia, F.¹ Perebeinos, V.² Lin, Y.M.³ Wu, Y.⁴ Avouris, P.⁵

21
- 73949113564
- 10.1088/0957-4484/21/5/055608
- W. S. Kim, S. Y. Moon, J. H. Lee, S. Y. Bang, B. G. Choi, H. Ham, T. Sekino, and K. B. Shim, Nanotechnology 21, 055608 (2010). 10.1088/0957-4484/21/ 5/055608
- (2010) Nanotechnology , vol.21 , pp. 055608
- Kim, W.S.¹ Moon, S.Y.² Lee, J.H.³ Bang, S.Y.⁴ Choi, B.G.⁵ Ham, H.⁶ Sekino, T.⁷ Shim, K.B.⁸

22
- 0001369873
- 10.1063/1.362673
- J. Roth, H. Graupner, S. P. Withrow, D. Zehner, and R. A. Zuhr, J. Appl. Phys. 79, 7695 (1996). 10.1063/1.362673
- (1996) J. Appl. Phys. , vol.79 , pp. 7695
- Roth, J.¹ Graupner, H.² Withrow, S.P.³ Zehner, D.⁴ Zuhr, R.A.⁵

23
- 0005852292
- 10.1103/PhysRevB.45.11968
- T. Tachibana, B. E. Williams, and J. T. Glass, Phys. Rev. B. 45, 11968 (1992). 10.1103/PhysRevB.45.11968
- (1992) Phys. Rev. B. , vol.45 , pp. 11968
- Tachibana, T.¹ Williams, B.E.² Glass, J.T.³

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