Reduction of hysteresis for carbon nanotube mobility measurements using pulsed characterization

Nanotechnology

Volumn 21, Issue 8, 2010, Pages

  Estrada, David ^a   Dutta, Sumit ^a   Liao, Albert ^a   Pop, Eric ^a,b  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DUTY CYCLES; GATE PULSE; GRAPHENES; MATERIAL SYSTEMS; MOBILITY MEASUREMENTS; NANOSCALE DEVICE; PULSED MEASUREMENTS; TEMPERATURE RANGE; TRAP DEPTH; VOLTAGE PULSE;

CHARGE TRAPPING; HYSTERESIS; MOLECULAR ELECTRONICS; RELAXATION PROCESSES; SILICON COMPOUNDS;

CARBON NANOTUBES;

EID: 76249084900     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/8/085702     Document Type: Article

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