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Volumn , Issue , 2013, Pages 1048-1052

Effect of die-attach materials and thickness on the reliability of HP-LED

Author keywords

Die attach Material; HP LED; Reliability; Thermal Resistance

Indexed keywords

DIES; DURABILITY; ELECTRONICS PACKAGING; HEAT RESISTANCE; LIGHT EMITTING DIODES; RELIABILITY;

EID: 84898050525     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICEPT.2013.6756639     Document Type: Conference Paper
Times cited : (5)

References (13)
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  • 4
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    • X. Li, X. Chen and G. Q. Lu, "Effect of Die-Attach Material on Performance and Reliability of High-Power Light-Emitting Diode Modules," in Proc Electron Compon Technol Conf, Las Vegas, pp. 1344-1346, June 2010.
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    • B. H. Liou, C. M. Chen, R. H. Horng, Y. C. Chiang and D. S. Wuu, "Improvement of thermal management of high-power GaN-based lightemitting diodes," in Microelectron. Reliab, vol. 52, n. 5, May 2012.
    • (2012) Microelectron. Reliab , vol.52 , Issue.5
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  • 6
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    • C. J. Chen, C. M. Chen, R. H. Horng, D. S. Wuu and J. S. Hong, "Thermal management and interfacial properties in high-power GaNbased light-emitting diodes employing diamond-added Sn-3 wt. %Ag-0. 5 wt. %Cu solder as a die-attach material," J. Electron. Mater, vol. 39, n. 12, pp. 2618-2626, Dec 2010.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.