Structural analyses of seeded thin film microcrystalline silicon solar cell

Progress in Photovoltaics: Research and Applications

Volumn 22, Issue 3, 2014, Pages 346-355

  Agbo, S N ^a   Dobrovolskiy, S ^a   Wegh, G ^a   Van Swaaij, R A C M M ^a   Tichelaar, F D ^b   Sutta, P ^c   Zeman, M ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^c UNIVERSITY OF WEST BOHEMIA   (Czech Republic)

Author keywords

crystallinity profile; seed layers; spectral response; thin film microcrystalline silicon

Indexed keywords

AMORPHOUS FILMS; CRACKS; CRYSTAL ORIENTATION; DEPOSITION; FILM GROWTH; GRAIN SIZE AND SHAPE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROCRYSTALLINE SILICON; OPEN CIRCUIT VOLTAGE; PLASMA CVD; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; SILICON; SOLAR CELLS; THIN FILM SOLAR CELLS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; VAPOR DEPOSITION; X RAY DIFFRACTION;

AMORPHOUS INCUBATION LAYERS; CRYSTALLINITIES; GROWTH OF THIN FILMS; PREFERENTIAL ORIENTATION; RADIO FREQUENCY PLASMA ENHANCED CHEMICAL VAPOR DEPOSITIONS; RAMAN MEASUREMENTS; SEED LAYER; SPECTRAL RESPONSE;

SILICON SOLAR CELLS;

EID: 84897907936     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.2274     Document Type: Article

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