Microstrain and grain-size analysis from diffraction peak width and graphical derivation of high-pressure thermomechanics

Journal of Applied Crystallography

Volumn 41, Issue 6, 2008, Pages 1095-1108

  Zhao, Yusheng ^a   Zhang, Jianzhong ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Grain size analysis; High pressure and temperature; Microstrain analysis; Peak width variation

Indexed keywords

EID: 56549112149     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889808031762     Document Type: Article

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