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Applied Physics Letters

Volumn 102, Issue 17, 2013, Pages

Atomic-scale chemical quantification of oxide interfaces using energy-dispersive X-ray spectroscopy

(4) Lu, Ping a Xiong, Jie b Van Benthem, Mark a Jia, Quanxi b

a SANDIA NATIONAL LABORATORIES (United States)

b LOS ALAMOS NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATION-CORRECTED; ANTIFERROMAGNETICS; CHEMICAL COMPOSITIONS; CHEMICAL PROFILES; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; OXIDE NANOSTRUCTURES; QUANTUM STRUCTURE; SCANNING TRANSMISSION ELECTRON MICROSCOPES;

ANTIFERROMAGNETISM; BISMUTH COMPOUNDS; ENERGY DISPERSIVE SPECTROSCOPY; MANGANESE OXIDE; TRANSMISSION ELECTRON MICROSCOPY;

ATOMS;

EID: 84877310286 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4804184 Document Type: Article

Times cited : (38)

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