A memory efficient method for fully three-dimensional object reconstruction with HAADF STEM

Ultramicroscopy

Volumn 141, Issue , 2014, Pages 22-31

  Van den Broek, W ^a   Rosenauer, A ^b   Van Aert, S ^c   Sijbers, J ^c   Van Dyck, D ^c  

^a UNIVERSITY OF ULM   (Germany)

^b UNIVERSITY OF BREMEN   (Germany)

^c UNIVERSITY OF ANTWERP   (Belgium)

Author keywords

Atomic resolution tomography; Depth sectioning; HAADF STEM; Multislice simulations; Object reconstruction

Indexed keywords

ATOMS; COMPUTERS; ELECTRIC IMPEDANCE TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC RESOLUTION; DEPTH SECTIONING; HAADF-STEM; MULTISLICE SIMULATIONS; OBJECT RECONSTRUCTION;

THREE DIMENSIONAL;

NANOCRYSTAL;

ARTICLE; COMPUTER MEMORY; COMPUTER SIMULATION; CONTROLLED STUDY; DEPTH SECTIONING; ELECTRON DIFFRACTION; ELECTRON TOMOGRAPHY; HIGH ANGLE ANNULAR DARK FIELD SCANNING TRANSMISSION ELECTRON MICROSCOPY; IMAGE DISPLAY; IMAGE PROCESSING; IMAGE QUALITY; IMAGE RECONSTRUCTION; IMAGING AND DISPLAY; MATHEMATICAL ANALYSIS; MATHEMATICAL COMPUTING; PROCESS DEVELOPMENT; SCANNING TRANSMISSION ELECTRON MICROSCOPY; STOICHIOMETRY; THREE DIMENSIONAL IMAGING;

EID: 84897394944     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2014.03.008     Document Type: Article

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