Sample corrugation affects the apparent bond lengths in atomic force microscopy

ACS Nano

Volumn 8, Issue 3, 2014, Pages 3006-3014

  Boneschanscher, Mark P ^a   Hämäläinen, Sampsa K ^b   Liljeroth, Peter ^b   Swart, Ingmar ^a  

^a UTRECHT UNIVERSITY   (Netherlands)

^b AALTO UNIVERSITY   (Finland)

Author keywords

atomic force microscopy; bond length; corrugation; graphene; tip relaxation

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARBON MONOXIDE; GRAPHENE; MOLECULES;

CORRUGATION; EPITAXIAL GRAPHENE; FREQUENCY MODULATION ATOMIC FORCE MICROSCOPY; LENGTH DETERMINATION; MOLECULAR MECHANICS SIMULATION; TIP RELAXATION; TIP-SAMPLE DISTANCE; TIP-SAMPLE INTERACTION;

BOND LENGTH;

EID: 84896958378     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn500317r     Document Type: Article

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