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Volumn 102, Issue 7, 2013, Pages

Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules

Author keywords

[No Author keywords available]

Indexed keywords

AFM; FUNCTIONALIZATIONS; HIGH RESOLUTION; KELVIN PROBE FORCE MICROSCOPY; LATERAL MANIPULATIONS; ORGANIC MOLECULES; SINGLE MOLECULE; THIN INSULATING FILM;

EID: 84874510846     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4793200     Document Type: Article
Times cited : (149)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.