Unconventional terahertz carrier relaxation in Graphene oxide: Observation of enhanced auger recombination due to defect saturation

ACS Nano

Volumn 8, Issue 3, 2014, Pages 2486-2494

  Kim, Jaeseok ^a   Oh, Juyeong ^a   In, Chihun ^a   Lee, Yun Shik ^b   Norris, Theodore B ^c   Jun, Seong Chan ^a   Choi, Hyunyong ^a  

^a Yonsei University   (South Korea)

^b OREGON STATE UNIVERSITY   (United States)

^c UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Auger recombination; defect saturation; graphene; graphene oxide; percolation behavior; ultrafast optical pump terahertz probe spectroscopy

Indexed keywords

AUGERS; DEFECTS; DYNAMICS; SOLVENTS;

ANNEALING TEMPERATURES; AUGER RECOMBINATION; GRAPHENE OXIDES; OPTICAL-PUMP TERAHERTZ-PROBE SPECTROSCOPY; PERCOLATION BEHAVIOR; PHOTOEXCITED CARRIERS; PHOTOINDUCED CONDUCTIVITIES; TRANSIENT CONDUCTIVITY;

GRAPHENE;

EID: 84896922126     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn406066f     Document Type: Article

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