Realization of metal-insulator transition and oxidation in silver nanowire percolating networks by terahertz reflection spectroscopy

ACS Applied Materials and Interfaces

Volumn 6, Issue 1, 2014, Pages 630-635

  Tsai, Yao Jiun ^a   Chang, Chi Ying ^a   Lai, Yi Chun ^a   Yu, Pei Chen ^a   Ahn, Hyeyoung ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

non Drude model; oxidation; percolation transition; silver nanowires; terahertz spectroscopy; transparent electrode

Indexed keywords

BACKSCATTERING FACTOR; MORPHOLOGICAL ANALYSIS; PERCOLATING NETWORKS; PERCOLATION THRESHOLDS; PERCOLATION TRANSITION; REFLECTION SPECTROSCOPY; SILVER NANOWIRES; TRANSPARENT ELECTRODE;

CONDUCTIVE FILMS; ELECTRIC RESISTANCE MEASUREMENT; ELECTRODES; ELECTROMAGNETIC WAVE REFLECTION; FLEXIBLE ELECTRONICS; NANOWIRES; OHMIC CONTACTS; OXIDATION; PERCOLATION (COMPUTER STORAGE); PERCOLATION (FLUIDS); SEMICONDUCTOR INSULATOR BOUNDARIES; TERAHERTZ SPECTROSCOPY;

METALS;

EID: 84892405463     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/am404717j     Document Type: Article

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