Ultrafast carrier trapping in microcrystalline silicon observed in optical pump-terahertz probe measurements

Applied Physics Letters

Volumn 79, Issue 9, 2001, Pages 1291-1293

  Uhd Jepsen, P ^a   Schairer, W ^b   Libon, I H ^b   Lemmer, U ^b   Hecker, N E ^b   Birkholz, M ^c   Lips, K ^c   Schall, M ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

^b UNIVERSITY OF MUNICH   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001562797     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1394953     Document Type: Article

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