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Volumn 115, Issue 8, 2014, Pages

Evaluation of determination methods of the Si/Al contact resistance of screen-printed passivated emitter and rear solar cells

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT RESISTANCE; METALLIZING; NUMERICAL METHODS; SEPARATION; SILICON SOLAR CELLS;

EID: 84896768330     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4867188     Document Type: Article
Times cited : (19)

References (33)
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    • (2012)
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  • 18
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  • 19
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    • See www.halm.de for h.a.l.m. elektronik GmbH, Frankfurt am Main, Germany.
  • 20
    • 84896757313 scopus 로고    scopus 로고
    • for BT Imaging, Sydney, Australia
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  • 22
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    • 10.1007/s10825-011-0367-6
    • P. P. Altermatt, J. Comput. Electron. 10, 314-330 (2011). 10.1007/s10825-011-0367-6
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    • Altermatt, P.P.1
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    • 84896742799 scopus 로고    scopus 로고
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    • H. Plagwitz, Ph.D. dissertation, University of Hannover, Faculty of Mathematics and Physics, Hannover, 2007.
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    • Ph.D. dissertation, University of Konstanz, Department of Physics, Konstanz
    • E. Urrejola, Ph.D. dissertation, University of Konstanz, Department of Physics, Konstanz, 2012.
    • (2012)
    • Urrejola, E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.