Analytical theory for extracting specific contact resistances of thick samples from the transmission line method

IEEE Electron Device Letters

Volumn 35, Issue 1, 2014, Pages 9-11

  Eidelloth, Stefan ^a   Brendel, Rolf ^a,b  

^a INSTITUTE FOR SOLAR ENERGY RESEARCH HAMELIN ISFH   (Germany)

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

Conformal mapping; contact resistance; finite element analysis; photovoltaic cells

Indexed keywords

ANALYTIC THEORY; ANALYTICAL THEORY; CONDUCTING LAYERS; FINITE ELEMENT SIMULATIONS; METAL-SEMICONDUCTOR CONTACTS; SPECIFIC CONTACT RESISTANCES; THICK SAMPLES; TRANSMISSION LINE METHODS;

CONFORMAL MAPPING; ELECTRIC LINES; FINITE ELEMENT METHOD; PHOTOVOLTAIC CELLS; TRANSMISSION LINE THEORY;

CONTACT RESISTANCE;

EID: 84891559663     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2013.2290602     Document Type: Article

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