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Volumn 27, Issue , 2012, Pages 95-102

Analysis and optimization of the bulk and rear recombination of screen-printed PERC solar cells

Author keywords

Photovoltaics; Silicon; Solar Cells; Surface Passivation

Indexed keywords


EID: 84874634637     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2012.07.035     Document Type: Conference Paper
Times cited : (45)

References (22)
  • 1
    • 0031348526 scopus 로고    scopus 로고
    • Optimized Al back surface field techniques for Si solar cells
    • S. Narasimha and A. Rohatgi, Optimized Al back surface field techniques for Si solar cells, Proceedings 26th IEEE PVSC, 1997, pp. 63-66
    • (1997) Proceedings 26th IEEE PVSC , pp. 63-66
    • Narasimha, S.1    Rohatgi, A.2
  • 3
    • 80053183937 scopus 로고    scopus 로고
    • Contact formation and recombination at screenprinted local Aluminum-Alloyed silicon solar cell base contacts
    • J. Mueller, K. Bothe, S. Gatz, H. Plagwitz, G. Schubert, and R. Brendel, "Contact formation and recombination at screenprinted local aluminum-alloyed Silicon solar cell base contacts", IEEE Transaction on electron devices, 58, no. 10, 2011, pp. 3239-3245
    • (2011) IEEE Transaction on Electron Devices , vol.58 , Issue.10 , pp. 3239-3245
    • Mueller, J.1    Bothe, K.2    Gatz, S.3    Plagwitz, H.4    Schubert, G.5    Brendel, R.6
  • 5
    • 0035281088 scopus 로고    scopus 로고
    • Surface passivation of silicon solar cells using Plasma-Enhanced Chemical-Vapourdeposited SiN films and thin thermal SiO2/plasma SiN stacks
    • J. Schmidt, M. Kerr, and A. Cuevas, Surface passivation of silicon solar cells using plasma-enhanced chemical-vapourdeposited SiN films and thin thermal SiO2/plasma SiN stacks, Semiconductor Science and Technology 16, 2001, pp. 164-170
    • (2001) Semiconductor Science and Technology , vol.16 , pp. 164-170
    • Schmidt, J.1    Kerr, M.2    Cuevas, A.3
  • 6
    • 73949100676 scopus 로고    scopus 로고
    • Effective surface passivation of crystalline silicon using ultrathin Al2O3 films and Al2O3/SiN
    • J. Schmidt, B. Veith, and R. Brendel, Effective surface passivation of crystalline silicon using ultrathin Al2O3 films and Al2O3/SiNx stacks, phys. stat. sol. (RRL) 3, 2009, pp. 287-289
    • (2009) X Stacks, Phys. Stat. Sol. (RRL) , vol.3 , pp. 287-289
    • Schmidt, J.1    Veith, B.2    Brendel, R.3
  • 7
    • 80052096838 scopus 로고    scopus 로고
    • Comparison of the thermal stability of single Al2O3 layers and Al2O3/SiNx stacks for the surface passivation of silicon
    • B. Veith, F. Werner, D. Zielke, R. Brendel, and J. Schmidt, Comparison of the thermal stability of single Al2O3 layers and Al2O3/SiNx stacks for the surface passivation of silicon, Energy Procedia 8, 2001, pp. 397-312
    • (2001) Energy Procedia , vol.8 , pp. 397-312
    • Veith, B.1    Werner, F.2    Zielke, D.3    Brendel, R.4    Schmidt, J.5
  • 11
    • 0027858020 scopus 로고
    • Extended spectral analysis of internal quantum efficiency
    • P. A. Basore, Extended spectral analysis of internal quantum efficiency, in Proceedings 23rd IEEE PVSC, 1993, pp. 147-152
    • (1993) Proceedings 23rd IEEE PVSC , pp. 147-152
    • Basore, P.A.1
  • 12
    • 0032613844 scopus 로고    scopus 로고
    • Effective diffusion lengths for minority carriers in solar cells as determined from internal quantum efficiency analysis
    • R. Brendel and U. Rau, Effective diffusion lengths for minority carriers in solar cells as determined from internal quantum efficiency analysis, Journal of Applied Physics 85, 1999, pp. 3634-3637
    • (1999) Journal of Applied Physics , vol.85 , pp. 3634-3637
    • Brendel, R.1    Rau, U.2
  • 13
    • 85030959251 scopus 로고    scopus 로고
    • www. pv-tools. de
  • 14
    • 84865174608 scopus 로고    scopus 로고
    • Evaluation of series resistance losses in Screen-Printed solar cells with local rear contacts
    • S. Gatz, T. Dullweber and R. Brendel, Evaluation of series resistance losses in screen-printed solar cells with local rear contacts, IEEE Journal of Photovoltaics, Vol 1, No. 1, 2011, pp. 37-42
    • (2011) IEEE Journal of Photovoltaics , vol.1 , Issue.1 , pp. 37-42
    • Gatz, S.1    Dullweber, T.2    Brendel, R.3
  • 15
    • 51749093065 scopus 로고    scopus 로고
    • Dynamic carrier lifetime imaging of silicon wafers using an Ingrared-Camera-Base approach
    • K. Ramspeck, S. Reissenweber, J. Schmidt, K. Bothe, and R. Brendel, Dynamic carrier lifetime imaging of silicon wafers using an ingrared-camera-base approach, Appl. Phys. Lett. 93 (10), 2008, pp. 102-104
    • (2008) Appl. Phys. Lett. , vol.93 , Issue.10 , pp. 102-104
    • Ramspeck, K.1    Reissenweber, S.2    Schmidt, J.3    Bothe, K.4    Brendel, R.5
  • 16
    • 78650860740 scopus 로고    scopus 로고
    • Recombination at Laser-Processed local base contacts by dynamic infrared lifetime mapping
    • J. Müller, K. Bothe, S. Gatz, F. Haase, C. Mader and R. Brendel "Recombination at laser-processed local base contacts by dynamic infrared lifetime mapping", Journal of Applied Physics. 108, 2010, p. 124513
    • (2010) Journal of Applied Physics , vol.108 , pp. 124-513
    • Müller, J.1    Bothe, K.2    Gatz, S.3    Haase, F.4    Mader, C.5    Brendel, R.6
  • 17
    • 0027541923 scopus 로고
    • Spreading resistance of a round ohmic contact
    • B. Gelmont and M. Shur, Spreading resistance of a round ohmic contact, Solid-State Electron., 36, no. 2, 1993, pp. 143-146
    • (1993) Solid-State Electron. , vol.36 , Issue.2 , pp. 143-146
    • Gelmont, B.1    Shur, M.2
  • 19
    • 80053183937 scopus 로고    scopus 로고
    • Contact formation and recombination at screenprinted local Aluminum-Alloyed Silicon solar cell base contacts
    • J. Müller, K. Bothe, S. Gatz, H. Plagwitz, G. Schubert, and R. Brendel, Contact formation and recombination at screenprinted local Aluminum-alloyed Silicon solar cell base contacts, Trans. Electr. Dev. 58, no. 10, 2010, pp. 3239-3245
    • (2010) Trans. Electr. Dev. , vol.58 , Issue.10 , pp. 3239-3245
    • Müller, J.1    Bothe, K.2    Gatz, S.3    Plagwitz, H.4    Schubert, G.5    Brendel, R.6
  • 20
    • 70450227192 scopus 로고    scopus 로고
    • Recombination lifetimes in highly Aluminum-Doped silicon
    • DOI: 10. 1063/1. 3253742
    • J. Schmidt, N. Thiemann, R. Bock and R. Brendel, Recombination lifetimes in highly aluminum-doped silicon, Journal of Applied Physics, 106, 2009, 093707, DOI: 10. 1063/1. 3253742
    • (2009) Journal of Applied Physics , vol.106 , pp. 093-707
    • Schmidt, J.1    Thiemann, N.2    Bock, R.3    Brendel, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.