메뉴 건너뛰기




Volumn 21, Issue 4, 2013, Pages 490-499

Accurate series resistance measurement of solar cells

Author keywords

characterization; resistance loss; series resistance; solar cell

Indexed keywords

ACCURATE ANALYSIS; ACCURATE MEASUREMENT; ALTERNATIVE METHODS; EXPERIMENTAL DATUM; ILLUMINATION INTENSITY; RESISTANCE LOSS; SERIES RESISTANCES; SPECTRAL MISMATCH;

EID: 84878181324     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.1216     Document Type: Article
Times cited : (63)

References (27)
  • 1
    • 50549192708 scopus 로고
    • Series resistance effects on solar cell measurements
    • Wolf M, and, Rauschenbach H,. Series resistance effects on solar cell measurements. Advanced Energy Conversion 1963; 3: 455-479.
    • (1963) Advanced Energy Conversion , vol.3 , pp. 455-479
    • Wolf, M.1    Rauschenbach, H.2
  • 2
    • 0006722298 scopus 로고
    • Theoretical analysis of the series resistance of a solar cell
    • Handy RJ,. Theoretical analysis of the series resistance of a solar cell. Solid-State Electronics 1967; 10: 765-775.
    • (1967) Solid-State Electronics , vol.10 , pp. 765-775
    • Handy, R.J.1
  • 3
    • 0017507098 scopus 로고
    • Sheet resistance component of series resistance in a solar cell as a function of grid geometry
    • Wyeth NC,. Sheet resistance component of series resistance in a solar cell as a function of grid geometry. Solid-State Electronics 1977; 20: 629-634. (Pubitemid 8543872)
    • (1977) Solid-State Electronics , vol.20 , Issue.7 , pp. 629-634
    • Wyeth N.Convers1
  • 4
    • 0017994801 scopus 로고
    • Solar-cell design based on a distributed diode analysis. Electron devices
    • Boone JL, and, van Doren TP,. Solar-cell design based on a distributed diode analysis. Electron devices. IEEE Transactions on 1978; 25: 767-771.
    • (1978) IEEE Transactions on , vol.25 , pp. 767-771
    • Boone, J.L.1    Van Doren, T.P.2
  • 5
    • 0020126867 scopus 로고
    • Distributed series resistance effects in solar cells. Electron devices
    • Nielsen LD,. Distributed series resistance effects in solar cells. Electron devices. IEEE Transactions on 1982; 29: 821-827.
    • (1982) IEEE Transactions on , vol.29 , pp. 821-827
    • Nielsen, L.D.1
  • 6
    • 0019069537 scopus 로고
    • Distributed series resistance in photovoltaic devices; Intensity and loading effects
    • Smirnov GM, and, Mahan JE,. Distributed series resistance in photovoltaic devices; intensity and loading effects. Solid-State Electronics 1980; 23: 1055-1058.
    • (1980) Solid-State Electronics , vol.23 , pp. 1055-1058
    • Smirnov, G.M.1    Mahan, J.E.2
  • 7
    • 0022686063 scopus 로고
    • Effect of distributed series resistance on the dark and illuminated current-voltage characteristics of solar cells
    • Araujo GL, Cuevas A, and, Ruiz JM,. The effect of distributed series resistance on the dark and illuminated current-voltage characteristics of solar cells. Electron devices. IEEE Transactions on 1986; 33: 391-401. (Pubitemid 16576206)
    • (1986) IEEE Transactions on Electron Devices , vol.ED-33 , Issue.3 , pp. 391-401
    • Araujo Gerardo, L.1    Cuevas Andres2    Ruiz Jose, M.3
  • 9
    • 0020191106 scopus 로고
    • New method for experimental determination of the series resistance of a solar cell
    • Araujo GL, and, Sanchez E,. A new method for experimental determination of the series resistance of a solar cell. Electron devices IEEE Transactions on 1982; 29: 1511-1513. (Pubitemid 13464672)
    • (1982) IEEE Transactions on Electron Devices , vol.ED-29 , Issue.10 , pp. 1511-1513
    • Araujo Gerardo, L.1    Sanchez Enrique2
  • 10
    • 0027813652 scopus 로고
    • A new method for accurate measurements of the lumped series resistance of solar cells
    • Louisville.
    • Aberle AG, Wenham SR, and, Green MA,. A new method for accurate measurements of the lumped series resistance of solar cells. Photovoltaic Specialists Conference, Louisville, 1993; 133-139.
    • (1993) Photovoltaic Specialists Conference , pp. 133-139
    • Aberle, A.G.1    Wenham, S.R.2    Green, M.A.3
  • 11
    • 77953009048 scopus 로고    scopus 로고
    • Loss analysis of emitter-wrap-through silicon solar cells by means of experiment and three-dimensional device modeling
    • Ulzhofer C, Altermatt PP, Harder N, and, Brendel R,. Loss analysis of emitter-wrap-through silicon solar cells by means of experiment and three-dimensional device modeling. Journal of Applied Physics 2010; 107: 104509.
    • (2010) Journal of Applied Physics , vol.107 , pp. 104509
    • Ulzhofer, C.1    Altermatt, P.P.2    Harder, N.3    Brendel, R.4
  • 12
    • 0029292138 scopus 로고
    • Limiting loss mechanisms in 23% efficient silicon solar cells
    • Aberle AG, Altermatt PP, Heiser G, et al,. Limiting loss mechanisms in 23% efficient silicon solar cells. Journal of Applied Physics 1995; 77: 3491-3504.
    • (1995) Journal of Applied Physics , vol.77 , pp. 3491-3504
    • Aberle, A.G.1    Altermatt, P.P.2    Heiser, G.3
  • 13
    • 2342598957 scopus 로고    scopus 로고
    • Advanced system for calibration and characterization of solar cells
    • Granek F, and, Zdanowicz T,. Advanced system for calibration and characterization of solar cells. OPTO-Electronics Review 2004; 12 (1): 57-67. (Pubitemid 38604167)
    • (2004) Opto-electronics Review , vol.12 , Issue.1 , pp. 57-67
    • Granek, F.1    Zdanowicz, T.2
  • 14
    • 34548247286 scopus 로고    scopus 로고
    • A review and comparison of different methods to determine the series resistance of solar cells
    • DOI 10.1016/j.solmat.2007.05.026, PII S0927024807002255
    • Pysch D, Mette A, and, Glunz SW,. A review and comparison of different methods to determine the series resistance of solar cells. Solar Energy Materials and Solar Cells, 2007; 91: 1698-1706. (Pubitemid 47321115)
    • (2007) Solar Energy Materials and Solar Cells , vol.91 , Issue.18 , pp. 1698-1706
    • Pysch, D.1    Mette, A.2    Glunz, S.W.3
  • 15
    • 0018434905 scopus 로고
    • Better approach to the evaluation of the series resistance of solar cells
    • Rajkanan K, and, Shewchun J,. A better approach to the evaluation of the series resistance of solar cells. Solid-State Electronics, 1979; 22: 193-197. (Pubitemid 9437035)
    • (1979) Solid State Electron , vol.22 , Issue.2 , pp. 193-197
    • Rajkanan, K.1    Shewchun, J.2
  • 16
    • 0017950696 scopus 로고
    • Experimental determination of series resistance of p-n junction diodes and solar cells
    • Chen PJ, Pao SC, Neugroschel A, and, Lindholm FA,. Experimental determination of series resistance of p-n junction diodes and solar cells. Electron Devices. IEEE Transactions on. 1978; 25: 386-388. (Pubitemid 8593755)
    • (1978) IEEE Transactions on Electron Devices , vol.ED-25 , Issue.3 , pp. 386-388
    • Chen, P.J.1    Pao, S.C.2    Neugroschel, A.3    Lindholm, F.A.4
  • 17
    • 0012403605 scopus 로고
    • Measurement of concentrator solar cell series resistance by flash testing
    • Chaffin RJ, and, Osbourn GC,. Measurement of concentrator solar cell series resistance by flash testing. Applied Physics Letters 1980; 37: 637-639.
    • (1980) Applied Physics Letters , vol.37 , pp. 637-639
    • Chaffin, R.J.1    Osbourn, G.C.2
  • 18
    • 0343890470 scopus 로고
    • Determination of series resistance of a solar cell by dynamic methods
    • Luxembourg.
    • Boucher J, Lescure M, and, Vialas J,. Determination of series resistance of a solar cell by dynamic methods. Photovoltaic Solar Energy Conference, Luxembourg, 1977; 1044-1055.
    • (1977) Photovoltaic Solar Energy Conference , pp. 1044-1055
    • Boucher, J.1    Lescure, M.2    Vialas, J.3
  • 20
    • 0030087214 scopus 로고    scopus 로고
    • On the data analysis of light biased photoconductance decay measurements
    • Armin GA, Jan S, and, Rolf B,. On the data analysis of light biased photoconductance decay measurements. Journal of Applied Physics 1996; 79: 1491-1496.
    • (1996) Journal of Applied Physics , vol.79 , pp. 1491-1496
    • Armin, G.A.1    Jan, S.2    Rolf, B.3
  • 21
    • 0033356030 scopus 로고    scopus 로고
    • Measurement of differential and actual recombination parameters on crystalline silicon wafers
    • DOI 10.1109/16.791991
    • Schmidt J,. Measurement of differential and actual recombination parameters on crystalline silicon wafers [solar cells]. Electron devices. IEEE Transactions on. 1999; 46: 2018-2025. (Pubitemid 30523987)
    • (1999) IEEE Transactions on Electron Devices , vol.46 , Issue.10 , pp. 2018-2025
    • Schmidt, J.1
  • 22
    • 0000987816 scopus 로고    scopus 로고
    • A quasi-steady-state open-circuit voltage method for solar cell characterization
    • Glasgow.
    • Sinton RA, and, Cuevas A,. A quasi-steady-state open-circuit voltage method for solar cell characterization. 16th European Photovoltaic Solar Energy Conference, Glasgow, 2000; 1152-1155.
    • (2000) 16th European Photovoltaic Solar Energy Conference , pp. 1152-1155
    • Sinton, R.A.1    Cuevas, A.2
  • 25
    • 21544445512 scopus 로고
    • Impact of illumination level and oxide parameters on Shockley-Read-Hall recombination at the Si-SiO2 interface
    • Aberle AG, Glunz S, and, Warta W,. Impact of illumination level and oxide parameters on Shockley-Read-Hall recombination at the Si-SiO2 interface. Journal of Applied Physics 1992; 71: 4422-4431.
    • (1992) Journal of Applied Physics , vol.71 , pp. 4422-4431
    • Aberle, A.G.1    Glunz, S.2    Warta, W.3
  • 26
    • 33244478754 scopus 로고    scopus 로고
    • The influence of diffusion-induced dislocations on high efficiency silicon solar cells
    • DOI 10.1109/TED.2005.863535
    • Cousins PJ, and, Cotter JE,. The influence of diffusion-induced dislocations on high efficiency silicon solar cells. Electron devices. IEEE Transactions on. 2006; 53: 457-464. (Pubitemid 43280597)
    • (2006) IEEE Transactions on Electron Devices , vol.53 , Issue.3 , pp. 457-464
    • Cousins, P.J.1    Cotter, J.E.2
  • 27
    • 27244458624 scopus 로고    scopus 로고
    • Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers
    • DOI 10.1007/s00339-005-3371-5
    • Macdonald D,. Impact of nickel contamination on carrier recombination in n- and p-type crystalline silicon wafers. Applied Physics A: Materials Science & Processing. 2005; 81: 1619-1625. (Pubitemid 41521289)
    • (2005) Applied Physics A: Materials Science and Processing , vol.81 , Issue.8 , pp. 1619-1625
    • MacDonald, D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.