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Volumn 110, Issue 2, 2011, Pages

Effect of incomplete ionization for the description of highly aluminum-doped silicon

Author keywords

[No Author keywords available]

Indexed keywords

ACCURATE MODELING; EXPERIMENTAL DATA; INCOMPLETE IONIZATION; INHOMOGENEITIES; PRECISE MODELING; RECOMBINATION MECHANISMS; SATURATION CURRENT DENSITIES; SI SURFACES;

EID: 79961101779     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3603043     Document Type: Article
Times cited : (37)

References (29)
  • 8
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    • Valencia, Spain
    • C. Schmiga, M. Rauer, M. Rüdiger, K. Meyer, J. Lossen, H.-J. Krokoszinski, M. Hermle, and S. W. Glunz, Proceedings of the 25th EU PVSEC, Valencia, Spain, 2010, pp. 1163-1168.
    • (2010) Proceedings of the 25th EU PVSEC , pp. 1163-1168
    • C. Schmiga1
  • 14
    • 79961111832 scopus 로고    scopus 로고
    • Sentaurus TCAD, release E-2010.12, Synopsys, Zürich, Switzerland
    • Sentaurus TCAD, release E-2010.12, Synopsys, Zürich, Switzerland.
  • 20
  • 26
    • 33845762895 scopus 로고    scopus 로고
    • P. P. Altermatt, A. Schenk, B. Schmithüsen, and G. Heiser, J. Appl. Phys. 100, 113715 (2006).
    • (2006) J. Appl. Phys. , vol.100 , pp. 113715
    • Altermatt, P.P.1
  • 29
    • 79959808651 scopus 로고    scopus 로고
    • Valencia, Spain
    • M. Rüdiger, C. Schmiga, M. Rauer, M. Hermle, and S. W. Glunz, Procedings of the 25th EU PVSEC, Valencia, Spain, 2010, pp. 2280-2286.
    • (2010) Procedings of the 25th EU PVSEC , pp. 2280-2286
    • M. Rüdiger1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.