An inexpensive approach for bright-field and dark-field imaging by scanning transmission electron microscopy in scanning electron microscopy

Microscopy and Microanalysis

Volumn 20, Issue 1, 2014, Pages 124-132

  Patel, Binay ^a   Watanabe, Masashi ^a  

^a Lehigh University   (United States)

Author keywords

Atomic number contrast (Z contrast); Holder development; Image resolution; Polymers; SMART macro; Soft materials

Indexed keywords

EID: 84896457847     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927613014049     Document Type: Article

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