STEM-in-SEM method for morphology analysis of polymer systems

Polymer

Volumn 52, Issue 5, 2011, Pages 1278-1285

  Guise, Olivier ^a   Strom, Carl ^a   Preschilla, Nisha ^b  

^a Technology Department   (United States)

^b RELIANCE INDUSTRIES LIMITED   (India)

Author keywords

Microscopy; STEM in SEM; TEM

Indexed keywords

MICROSCOPIC EXAMINATION; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

DISCRETE COMPONENTS; ENGINEERING THERMOPLASTICS; HIGH MAGNIFICATIONS; HIGH QUALITY IMAGES; LARGE FIELD OF VIEWS; MANUFACTURING ENVIRONMENTS; MORPHOLOGY ANALYSIS; POLYMER CHARACTERIZATION;

POLYMERS;

EID: 79952004901     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2011.01.030     Document Type: Article

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