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Physical Review Letters

Volumn 112, Issue 6, 2014, Pages

Metastable defect formation at microvoids identified as a source of light-induced degradation in a - Si: H

(8) Fehr, M a Schnegg, A a Rech, B a Astakhov, O b Finger, F b Bittl, R c Teutloff, C c Lips, K a

a HAHN MEITNER INSTITUT (Germany)

b FORSCHUNGSZENTRUM JÜLICH (Germany)

c FREIE UNIVERSITÄT BERLIN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84894429844 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.112.066403 Document Type: Article

Times cited : (68)

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