Relation of the Si H stretching frequency to the nanostructural Si H bulk environment

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 7, 2007, Pages

  Smets, A H M ^a   Van De Sanden, M C M ^b  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34548083071     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.073202     Document Type: Article

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