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Volumn 58, Issue 2, 2014, Pages 251-265

An occupational exposure assessment for engineered nanoparticles used in semiconductor fabrication

Author keywords

CMP; exposure assessment; nanoparticle; semiconductor

Indexed keywords

AEROSOL; AIR POLLUTANT; ALUMINUM OXIDE; INFUSORIAL EARTH; NANOPARTICLE;

EID: 84894282404     PISSN: 00034878     EISSN: 14753162     Source Type: Journal    
DOI: 10.1093/annhyg/met064     Document Type: Article
Times cited : (51)

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