Corrigendum: Study on the reflectivity properties of spherically bent analyser crystals (Journal of Synchrotron Radiation (2014) 21 (104-110) DOI: 10.1107/S160057751302242X);Study on the reflectivity properties of spherically bent analyser crystals

Journal of Synchrotron Radiation

Volumn 21, Issue 1, 2014, Pages 104-110

  Honkanen, Ari Pekka ^a   Verbeni, Roberto ^b   Simonelli, Laura ^b   Moretti Sala, Marco ^b   Monaco, Giulio ^b,c   Huotari, Simo ^a  

^a Department of Physics ^*  (Finland)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^c UNIVERSITY OF TRENTO   (Italy)

Author keywords

bent crystals; high energy resolution analysers; inelastic X ray scattering

Indexed keywords

REFLECTION; SYNCHROTRON RADIATION; SYNCHROTRONS;

ANISOTROPIC PROPERTY; BACKSCATTERING GEOMETRY; BENT CRYSTALS; HIGH-ENERGY RESOLUTION; INELASTIC X RAY SCATTERING; REFLECTIVITY CURVE; SYNCHROTRON BEAMLINES; X RAY SPECTROMETRY;

X RAY SCATTERING;

EID: 84891618130     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577516019287     Document Type: Erratum

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