Spherically bent analyzers for resonant inelastic X-ray scattering with intrinsic resolution below 200 meV

Journal of Synchrotron Radiation

Volumn 12, Issue 4, 2005, Pages 473-478

  Collart, Emilie ^a   Shukla, Abhay ^a   Gélébart, Frédéric ^a   Morand, Marc ^a   Malgrange, Cécile ^a   Bardou, Nathalie ^b   Madouri, Ali ^b   Pelouard, Jean Luc ^b  

^a UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

^b CNRS   (France)

Author keywords

Anodic bonding; High resolution analyzer; RIXS

Indexed keywords

ELECTRONIC STRUCTURE; OPTICAL RESOLVING POWER; RESONANCE; TRANSITION METALS;

ANODIC BONDING; ENERGY RESOLUTION; HIGH-RESOLUTION ANALYZERS; RIXS;

X RAY SCATTERING;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; METHODOLOGY; RADIATION SCATTERING; SPECTROMETRY; TRANSDUCER; VALIDATION STUDY; X RAY; X RAY DIFFRACTION;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; SCATTERING, RADIATION; SPECTROMETRY, X-RAY EMISSION; TRANSDUCERS; X-RAY DIFFRACTION; X-RAYS;

EID: 23844551586     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S090904950501472X     Document Type: Conference Paper

References (24)

1. Abbamonte, P., Burns, C. A., Isaacs, E. D., Platzman, P. M., Miller, L. L., Cheong, S. W. & Klein, M. V. (1999). Phys. Rev. Lett. 83, 860-863.
2. Albaugh, K. B., Cade, P. E. & Rasmussen, D. H. (1988). Solid State Sensor and Actuator Workshop, Hilton Head Island, SC, USA, pp. 109-110. IEEE Report.
3. Anthony, T. R. (1983). J. Appl. Phys. 54, 2419-2428.
4. Bergman, U. & Cramer, S. P. (1998). Proc. SPIE, 3448, 198-209.
5. Caliebe, W. A., Kao, C.-C, Hastings, J. B., Taguchi, M., Kotani, A., Uozumi, T. & de Groot, F. M. F. (1998). Phys. Rev. B, 58, 13452-13458.
6. Diamant, R., Huotari, S., Hämäläinen, K., Sharon, R., Kao, C. C. & Deusch, M. (2003). Phys. Rev. Lett. 91, 193001-1-193001-4.
7. Döring, G., Sternemann, C., Kaprolat, A., Mattila, A., Hämäläinen, K. & Schülke, W. (2004). Phys. Rev. B, 70, 85115-1-85115-15.
8. Enkisch, H., Kaprolat, A., Schülke, W., Krisch, M. H. & Lorenzen, M. (1999). Phys. Rev. B, 60, 8624-8627.
9. Galambosi, S., Sutinen, H., Mattila, A., Hämäläinen, K., Sharon, R., Kao, C. C. & Deusch, M. (2003). Phys. Rev. A, 67, 22510-1-22510-5.
10. Gracias, A. C., Rios, A. N., Maia, I. A. & Senna, J. R. (2000). Rev. Bras. Aplic. Vacuo, 19, 19-22.
11. Gronkowski, J. (1991). Phys. Rep. 206, 1-41.
12. Hämäläinen, K., Siddons, D. P., Hastings, J. B. & Berman, L. E. (1991). Phys. Rev. Lett. 67, 2850-2853.
13. Hämäläinen, K., Hill, J. P., Huotari, S., Kao, C.-C, Berman, L. E., Kotani, A., Idé, T., Peng, J. L. & Greene, R. L. (2000). Phys. Rev. B, 61, 1836-1840.
14. Hill, J. P., Kao, C.-C., Caliebe, C., Gibbs, D. & Hastings, J. B. (1996). Phys. Rev. Lett. 77, 3665-3668.
15. Hill, J. P., Kao, C.-C, Caliebe, W. A. L., Matsubara, M., Kotani, A., Peng, J. L. & Greene, R. L. (1998). Phys. Rev. Lett. 80, 4967-4970.
16. Isaacs, E. D., Platzman, P. M., Metcalf, P. & Honing, J. M. (1996). Phys. Rev. Lett. 76, 4211-4214.
17. Johann, H. H. (1931). Z. Phys. 69, 185-206.
18. Kao, C.-C, Caliebe, W. A. L. & Hastings, J. B. (1996). Phys. Rev. B, 54, 16361-16364.
19. Kim, Y. J., Hill, J. P., Burns, C. A., Wakimto, S., Birgeneau, R. J., Casa, D., Grog, T. & Venkataraman, C. T. (2002). Phys. Rev. Lett. 89, 177003-1-177003-4.
20. Masciovecchio, C., Bergmann, U., Krisch, M., Ruocco, G., Sette, F. & Verbeni, R. (1996). Nucl. Instrum. Methods, B111, 181-186.
21. Suortti, P., Pattison, P. & Weyrich, W. (1986). J. Appl Cryst. 19, 343-352.
22. Taupin, D. (1964). Bull. Soc. Fr. Mineral. Cristallogr. 87, 469-511.
23. Wallis, G. & Pomerantz, D. I. (1969). J. Appl. Phys. 40, 3946-3949.
24. Wei, J., Nai, M. L., Wong, C. K. & Lee, L. C. (2003). J. Micromech. Microeng. 13, 217-222.