A perfect crystal X-ray analyser with 1.5 meV energy resolution

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 117, Issue 3, 1996, Pages 339-340

  Masciovecchio, C ^a   Bergmann, U ^a   Krisch, M ^a   Ruocco, G ^b   Sette, F ^a   Verbeni, R ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF L'AQUILA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRYSTAL LATTICES; CRYSTALS; REFLECTION; SILICON;

BACKSCATTERING ANALYSER; ENERGY RESOLUTION; SILICON CRYSTAL ANALYSER; X RAY SCATTERING;

X RAY ANALYSIS;

EID: 0030245379     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/0168-583X(96)00334-5     Document Type: Letter

References (4)

1. C. Masciovecchio, U. Bergmann, M. Krisch, G. Ruocco, F. Sette and R. Verbeni, Nucl. Instr. and Meth. B 111 (1996) 181.
2. F. Sette, G. Ruocco, M. Krisch, U. Bergmann, C. Masciovecchio, V. Mazzacurati, G. Signorelli and R. Verbeni, Phys. Rev. Lett. 75 (1995) 850.
3. G. Ruocco, F. Sette, U. Bergmann, M. Krisch, C. Masciovecchio, V. Mazzacurati, G. Signorelli and R. Verbeni, Nature 379 (1996) 521.
4. C. Masciovecchio, G. Ruocco, F. Sette, M. Krisch, R. Verbeni, U. Bergmann and M. Soltwisch, Phys. Rev. Lett. 76 (1996) 3356.