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Volumn 18, Issue 3, 2011, Pages 492-496

New developments in fabrication of high-energy-resolution analyzers for inelastic X-ray spectroscopy

Author keywords

high energy resolution analyzers; inelastic X ray scattering spectroscopy

Indexed keywords

HIGH ENERGY; INELASTIC X RAY SCATTERING; MEV ENERGY; RADIUS OF CURVATURE; X-RAY ANALYZERS;

EID: 79955551938     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049511001828     Document Type: Article
Times cited : (90)

References (15)
  • 5
    • 79955555169 scopus 로고
    • Technical Report VIII-95. SSRL, Stanford, CA, USA
    • Fujii Y., Hastings J., Ulc S. & Monctonl D. (1982). Technical Report VIII-95. SSRL, Stanford, CA, USA.
    • (1982)
    • Fujii, Y.1    Hastings, J.2    Ulc, S.3    Monctonl, D.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.