Improving the performance of high-resolution X-ray spectrometers with position-sensitive pixel detectors

Journal of Synchrotron Radiation

Volumn 12, Issue 4, 2005, Pages 467-472

  Huotari, S ^a   Vanko Gy ^a   Albergamo, F ^a   Ponchut, C ^a   Graafsma, H ^a   Henriquet, C ^a   Verbeni, R ^a   Monaco, G ^a  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

Diced analyzer crystals; Position sensitive detectors; X ray spectrometers

Indexed keywords

BACKSCATTERING; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; CRYSTALLOGRAPHY; OPTICAL RESOLVING POWER; RADIATION DETECTORS;

BACKSCATTERING GEOMETRY; DICED ANALYZER CRYSTALS; PIXEL DETECTORS; POSITION-SENSITIVE DETECTORS;

X RAY SPECTROMETERS;

ARTICLE; COMPARATIVE STUDY; EQUIPMENT; EQUIPMENT DESIGN; EVALUATION; INSTRUMENTATION; METHODOLOGY; SIGNAL PROCESSING; SPECTROMETRY; TRANSDUCER; VALIDATION STUDY; X RAY DIFFRACTION;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; SIGNAL PROCESSING, COMPUTER-ASSISTED; SPECTROMETRY, X-RAY EMISSION; TRANSDUCERS; X-RAY DIFFRACTION;

EID: 23844492573     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049505010630     Document Type: Conference Paper

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