High-resolution spectroscopy on an X-ray absorption beamline

Journal of Synchrotron Radiation

Volumn 16, Issue 2, 2009, Pages 283-292

  Hazemann, Jean Louis ^a   Proux, Olivier ^b   Nassif, Vivian ^c   Palancher, Hervé ^d   Lahera, Eric ^b   Da Silva, Cécile ^a   Braillard, Aurélien ^a   Testemale, Denis ^a   Diot, Marie Ange ^a   Alliot, Isabelle ^c   Del Net, William ^b   Manceau, Alain ^b   Gélébart, Frédéric ^e   Morand, Marc ^e   Dermigny, Quentin ^e   Shukla, Abhay ^e  

^a CNRS   (France)

^b UNIV GRENOBLE ALPES   (France)

^c CEA GRENOBLE   (France)

^d IRFM   (France)

^e UNIVERSITÉ PIERRE ET MARIE CURIE   (France)

Author keywords

Bent crystal; High resolution X ray analyzer; Inelastic X ray scattering; X ray absorption spectroscopy

Indexed keywords

SPECTROSCOPIC ANALYSIS; SYNCHROTRON RADIATION; X RAY ABSORPTION SPECTROSCOPY; X RAY SCATTERING;

BENT CRYSTALS; EUROPEAN SYNCHROTRON RADIATION FACILITIES; FLUORESCENCE DETECTION; HIGH-RESOLUTION SPECTROSCOPY; INELASTIC X RAY SCATTERING; RESONANT INELASTIC X-RAY SCATTERING; X-RAY ANALYZERS; X-RAY RAMAN SCATTERINGS;

SPECTROMETERS;

ARTICLE; COMPUTER AIDED DESIGN; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SPECTROMETRY; TRANSDUCER;

COMPUTER-AIDED DESIGN; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTROMETRY, X-RAY EMISSION; TRANSDUCERS;

EID: 61449207269     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049508043768     Document Type: Article

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