Imaging doped holes in a cuprate superconductor with high-resolution compton scattering

Science

Volumn 332, Issue 6030, 2011, Pages 698-702

  Sakurai, Y ^a   Itou, M ^a   Barbiellini, B ^b   Mijnarends, P E ^b,c   Markiewicz, R S ^b   Kaprzyk, S ^b,d   Gillet, J M ^e   Wakimoto, S ^f   Fujita, M ^g   Basak, S ^b   Wang, Yung Jui ^b   Al Sawai, W ^b   Lin, H ^b   Bansil, A ^b   Yamada, K ^g,h  

^a JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

^b NORTHEASTERN UNIVERSITY   (United States)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^d AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^e LABORATOIRE STRUCTURES   (France)

^f JAPAN ATOMIC ENERGY AGENCY   (Japan)

^g TOHOKU UNIVERSITY   (Japan)

^h TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVITY; HIGH TEMPERATURE; RESOLUTION; SCATTERING;

ARTICLE; COMPTON EFFECT; CRYSTAL STRUCTURE; HIGH TEMPERATURE; MEASUREMENT; PRIORITY JOURNAL; ROOM TEMPERATURE; SENSITIVITY ANALYSIS; SUPERCONDUCTOR; SURFACE PROPERTY;

EID: 79955747594     PISSN: 00368075     EISSN: 10959203     Source Type: Journal    
DOI: 10.1126/science.1199391     Document Type: Article

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