Tuning of ripple patterns and wetting dynamics of Si (100) surface using ion beam irradiation

Current Applied Physics

Volumn 14, Issue 3, 2014, Pages 312-317

  Kumar, Tanuj ^a   Singh, U B ^a   Kumar, Manish ^b   Ojha, Sunil ^a   Kanjilal, D ^a  

^a INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^b CENTRAL UNIVERSITY OF RAJASTHAN   (India)

Author keywords

AFM; Contact angle; RBS; Ripple; Roughness; SEM

Indexed keywords

AFM; DYNAMICAL EVOLUTION; ION BEAM IRRADIATION; ION-BEAM SPUTTERING; NEAR SURFACE REGIONS; RBS; RIPPLE; STYLUS PROFILOMETER;

CONTACT ANGLE; CONTINUUM MECHANICS; ETCHING; ION BEAMS; IRRADIATION; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; WETTING;

SILICON;

EID: 84891608725     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2013.12.007     Document Type: Article

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