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Volumn 103, Issue 13, 2013, Pages

An approach to tune the amplitude of surface ripple patterns

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS LAYER; AMORPHOUS/CRYSTALLINE INTERFACE; BEAM IRRADIATION; RIPPLE PATTERNS; RUTHERFORD BACKSCATTERING CHANNELING; SI(1 0 0); SURFACE RIPPLES;

EID: 84885010940     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4822302     Document Type: Article
Times cited : (20)

References (14)
  • 13
    • 84857062775 scopus 로고    scopus 로고
    • 10.1016/j.apsusc.2011.09.008
    • M. Castro and R. Cuerno, Appl. Surf. Sci. 258 (9), 4171-4178 (2012). 10.1016/j.apsusc.2011.09.008
    • (2012) Appl. Surf. Sci. , vol.258 , Issue.9 , pp. 4171-4178
    • Castro, M.1    Cuerno, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.