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Applied Surface Science

Volumn 258, Issue 9, 2012, Pages 4148-4151

Formation of nanodots on GaAs by 50 keV Ar + ion irradiation

(5) Kumar, Tanuj a Khan, S A a Singh, U B a Verma, S a Kanjilal, D a

a INTER UNIVERSITY ACCELERATOR CENTRE (India)

Author keywords

Atomic force microscopy (AFM); Ripples; Sputtering

Indexed keywords

ATOMIC FORCE MICROSCOPY; GALLIUM ARSENIDE; III-V SEMICONDUCTORS; ION BOMBARDMENT; IONS; NANODOTS; RAMAN SPECTROSCOPY; SEMICONDUCTING GALLIUM; SPUTTERING; SURFACE ROUGHNESS;

AVERAGE DIAMETER; FLUENCE RANGE; IRRADIATED SURFACE; NANOPATTERNING; NONLINEAR BEHAVIOR; RIPPLES; SEMI-INSULATING GAAS; SURFACE NORMALS;

VANADIUM COMPOUNDS;

EID: 84857054457 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2011.07.005 Document Type: Conference Paper

Times cited : (34)

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