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Volumn 4, Issue 1, 2014, Pages 58-63

Fully ion-implanted and screen-printed 20.2% efficient front junction silicon cells on 239 cm 2 n-type cz substrate

Author keywords

Back surface field (BSF); ion implantation; n type wafer; planarization; screen printed

Indexed keywords

AVERAGE EFFICIENCIES; BACKSURFACE FIELD; CZOCHRALSKI WAFERS; HIGH-EFFICIENCY; N-TYPE WAFER; PLANARIZATION; SCREEN-PRINTED; SURFACE PASSIVATION;

EID: 84891555331     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2013.2281106     Document Type: Article
Times cited : (29)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.