Electrically driven tuning of the dielectric constant in MoS2 layers

ACS Nano

Volumn 7, Issue 12, 2013, Pages 10741-10746

  Santos, Elton J G ^a,b,c   Kaxiras, Efthimios ^a  

^a HARVARD UNIVERSITY   (United States)

^b Stanford University   (United States)

^c SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

Author keywords

dielectric response; electrostatic exfoliation; excitations; MoS2 dielectric constant; tunable dielectric properties

Indexed keywords

DIELECTRIC RESPONSE; EFFECTIVE DIELECTRIC CONSTANTS; ELECTRONIC STRUCTURE CALCULATIONS; EXCITATIONS; EXTERNAL ELECTRIC FIELD; TUNABLE DIELECTRIC PROPERTIES; TWO-DIMENSIONAL MATERIALS; VAN DER WAALS INTERACTIONS;

CALCULATIONS; DIELECTRIC PROPERTIES; ELECTRIC FIELDS; ELECTRONIC STRUCTURE; REFRACTIVE INDEX; VAN DER WAALS FORCES;

MOLYBDENUM COMPOUNDS;

EID: 84891365067     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn403738b     Document Type: Article

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