Surface potential and interlayer screening effects of few-layer MoS 2 nanoflakes

Applied Physics Letters

Volumn 102, Issue 14, 2013, Pages

  Li, Yang ^a   Xu, Cheng Yan ^a   Zhen, Liang ^a  

^a HARBIN INSTITUTE OF TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BUILT-IN ELECTRIC FIELDS; CHARGE TRANSFER MODEL; CONDUCTIVE ATOMIC FORCE MICROSCOPY; FOWLER-NORDHEIM TUNNELING; SCREENING EFFECT; SCREENING LENGTHS; TRANSPORT MECHANISM; TRAPPED CHARGE;

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; SURFACE POTENTIAL;

MOLYBDENUM COMPOUNDS;

EID: 84876388330     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4801844     Document Type: Article

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