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Volumn 25, Issue 6, 2013, Pages 899-903

Electric-field screening in atomically thin layers of MoS2: The role of interlayer coupling

Author keywords

electric field screening; electrostatic force microscopy (EFM); MoS2; Thomas Fermi theory; two dimensional crystals

Indexed keywords

CHARGE IMPURITIES; ELECTROSTATIC FORCE MICROSCOPY; ELECTROSTATIC SCREENING; INTERLAYER COUPLING; MOS2; THIN LAYERS; THOMAS-FERMI; TWO-DIMENSIONAL CRYSTALS;

EID: 84873665487     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201203731     Document Type: Article
Times cited : (152)

References (45)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.