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Nanotechnology

Volumn 25, Issue 2, 2014, Pages

The conductive properties of single DNA molecules studied by torsion tunneling atomic force microscopy

(4) Wang, W a Niu, D X b Jiang, C R a Yang, X J a

a FUDAN UNIVERSITY (China)

b SHANGHAI INSTITUTE OF APPLIED PHYSICS (China)

Author keywords

DNA; conductance; metallic DNA; torsion tunneling atomic force microscopy (TR TUNA)

Indexed keywords

CONDUCTIVE PROPERTIES; CURRENT SIGNAL; DNA CHAINS; DNA MOLECULES; ELECTRICAL TRANSPORT; METAL CLUSTER; SINGLE DNA MOLECULES;

ATOMIC FORCE MICROSCOPY; CHAINS; ELECTRIC CONDUCTANCE; METALLIZING; MOLECULES; TORSIONAL STRESS;

DNA;

COPPER; DNA; SILVER;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRIC CONDUCTIVITY; METHODOLOGY;

COPPER; DNA; ELECTRIC CONDUCTIVITY; MICROSCOPY, ATOMIC FORCE; SILVER;

EID: 84890774563 PISSN: 09574484 EISSN: 13616528 Source Type: Journal
DOI: 10.1088/0957-4484/25/2/025707 Document Type: Article

Times cited : (6)

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