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Faraday Discussions

Volumn 131, Issue , 2006, Pages 367-376

Electrical characterization of self-assembled single- and double-stranded DNA monolayers using conductive AFM

(6) Cohen, Hezy a Nogues, Claude a,b Ullien, Daniela a Daube, Shirley b Naaman, Ron b Porath, Danny a

a HEBREW UNIVERSITY OF JERUSALEM (Israel)

b WEIZMANN INSTITUTE OF SCIENCE (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

DNA;

ADSORPTION; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; EVALUATION; MECHANICAL STRESS; METHODOLOGY; MICROELECTRODE; SURFACE PROPERTY; ULTRASTRUCTURE;

ADSORPTION; CRYSTALLIZATION; DNA; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; MICROELECTRODES; MICROSCOPY, ATOMIC FORCE; STRESS, MECHANICAL; SURFACE PROPERTIES;

EID: 33645778056 PISSN: 13596640 EISSN: 13645498 Source Type: Journal
DOI: 10.1039/b507706k Document Type: Article

Times cited : (66)

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