-
1
-
-
0003576507
-
Lithography
-
Prentice Hall: Upper Saddle River, NJ
-
Plummer, J. D.; Deal, M. D.; Griffin, P. B. Lithography. Silicon VLSI Technology; Prentice Hall: Upper Saddle River, NJ, 2000; pp 211-220.
-
(2000)
Silicon VLSI Technology
, pp. 211-220
-
-
Plummer, J.D.1
Deal, M.D.2
Griffin, P.B.3
-
3
-
-
0000296072
-
Electron beam lithography
-
RaiChoudhury, P., Ed.; SPIE Press: Bellingham, WA
-
McCord, M.; Rooks, M. Electron Beam Lithography. In Handbook of Microlithography, Micromachining, and Microfabrication; RaiChoudhury, P., Ed.; SPIE Press: Bellingham, WA, 1997; Vol. 1, pp 139-249.
-
(1997)
Handbook of Microlithography, Micromachining, and Microfabrication
, vol.1
, pp. 139-249
-
-
McCord, M.1
Rooks, M.2
-
4
-
-
0035803316
-
-
Storm, A. J.; van Noort, J.; de Vries, S.; Dekker, C. Appl. Phys. Lett. 2001, 79, 3881-3883.
-
(2001)
Appl. Phys. Lett.
, vol.79
, pp. 3881-3883
-
-
Storm, A.J.1
Van Noort, J.2
De Vries, S.3
Dekker, C.4
-
5
-
-
0032546024
-
-
Braun, E.; Eichen, Y.; Sivan, U.; Ben-Yoseph, G. Nature (London) 1998, 391, 775-778.
-
(1998)
Nature (London)
, vol.391
, pp. 775-778
-
-
Braun, E.1
Eichen, Y.2
Sivan, U.3
Ben-Yoseph, G.4
-
6
-
-
0037025199
-
-
Keren, K.; Krueger, M.; Gilad, R.; Ben-Yoseph, G.; Sivan, U.; Braun, E. Science (Washington, D.C.) 2002, 297, 72-75.
-
(2002)
Science (Washington, D.C.)
, vol.297
, pp. 72-75
-
-
Keren, K.1
Krueger, M.2
Gilad, R.3
Ben-Yoseph, G.4
Sivan, U.5
Braun, E.6
-
7
-
-
0035803388
-
-
Ford, W.; Harnack, O.; Yasuda, A.; Wessels, J. Adv. Mater. 2001, 13, 1793-1797.
-
(2001)
Adv. Mater.
, vol.13
, pp. 1793-1797
-
-
Ford, W.1
Harnack, O.2
Yasuda, A.3
Wessels, J.4
-
8
-
-
0036472232
-
-
Seidel, R.; Mertig, M.; Pompe, W. Surf. Interface Anal. 2002, 33, 151-154.
-
(2002)
Surf. Interface Anal.
, vol.33
, pp. 151-154
-
-
Seidel, R.1
Mertig, M.2
Pompe, W.3
-
9
-
-
0033887150
-
-
Richter, J.; Seidel, R.; Kirsch, R.; Mertig, M.; Pompe, W.; Plaschke, J. ; Schackert, H. K. Adv. Mater. 2000, 12, 507-510.
-
(2000)
Adv. Mater.
, vol.12
, pp. 507-510
-
-
Richter, J.1
Seidel, R.2
Kirsch, R.3
Mertig, M.4
Pompe, W.5
Plaschke, J.6
Schackert, H.K.7
-
10
-
-
0001376751
-
-
Richter, J.; Mertig, M.; Pompe, W.; Mönch, I.; Schackert, H. K. Appl. Phys. Lett. 2001, 78, 536-538.
-
(2001)
Appl. Phys. Lett.
, vol.78
, pp. 536-538
-
-
Richter, J.1
Mertig, M.2
Pompe, W.3
Mönch, I.4
Schackert, H.K.5
-
11
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0003576507
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Thin film deposition
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Prentice Hall: Upper Saddle River, NJ
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Plummer, J. D.; Deal, M. D.; Griffin, P. B. Thin Film Deposition. Silicon VLSI Technology; Prentice Hall: Upper Saddle River, NJ, 2000; pp 570-572.
-
(2000)
Silicon VLSI Technology
, pp. 570-572
-
-
Plummer, J.D.1
Deal, M.D.2
Griffin, P.B.3
-
12
-
-
0031281392
-
-
Routier, S.; Bernier, J. L.; Catteau, J. P.; Colson, P.; Houssier, C.; Rivalle, C.; Bisagni, E.; Bailly, C. Bioconjugate Chem. 1997, 8, 789-792.
-
(1997)
Bioconjugate Chem.
, vol.8
, pp. 789-792
-
-
Routier, S.1
Bernier, J.L.2
Catteau, J.P.3
Colson, P.4
Houssier, C.5
Rivalle, C.6
Bisagni, E.7
Bailly, C.8
-
13
-
-
0018638739
-
-
Sigman, D. S.; Graham, D. R.; D'Aurora, V.; Stern, A. M. J. Biol. Chem. 1979, 254, 12269-12272.
-
(1979)
J. Biol. Chem.
, vol.254
, pp. 12269-12272
-
-
Sigman, D.S.1
Graham, D.R.2
D'Aurora, V.3
Stern, A.M.4
-
15
-
-
0141658471
-
-
note
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Images were obtained using a Multimode IIIa AFM and microfabricated Si cantilever tips (Digital Instruments, Santa Barbara, CA). Vibrational noise was reduced by using an active isolation system (MOD1-M, Halcyonics, Goettingen, Germany). During imaging, parameter settings were (i) resonant frequencies, 60-80 kHz; (ii) free oscillation amplitude, 0.5-1.0 V; (iii) setpoint, 0.3-0.7 V; and (iv) scan rate, 1.0-1.8 Hz.
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-
-
-
16
-
-
0034819152
-
-
Hafner, J. H.; Cheung, C. L.; Oosterkamp, T. H.; Lieber, C. M. J. Phys. Chem. B 2001, 105, 743-746.
-
(2001)
J. Phys. Chem. B
, vol.105
, pp. 743-746
-
-
Hafner, J.H.1
Cheung, C.L.2
Oosterkamp, T.H.3
Lieber, C.M.4
-
17
-
-
0033758356
-
-
Woolley, A. T.; Cheung, C. L.; Hafner, J. H.; Lieber, C. M Chem. Biol. 2000, 7, R193-R204.
-
(2000)
Chem. Biol.
, vol.7
-
-
Woolley, A.T.1
Cheung, C.L.2
Hafner, J.H.3
Lieber, C.M.4
-
19
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0141770422
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note
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To affix a nanotube to an AFM tip, the tip was used to image a silicon surface on which single-walled carbon nanotubes had been grown as described in ref 16. The Si surface with nanotubes was kindly provided by Professor Charles Lieber's group at Harvard University. When the tip contacted a nanotube that was vertically oriented, the nanotube occasionally detached from the surface and associated with the tip, resulting in an apparent change in the height of the image. When this type of abrupt jump in height was detected, the tip was checked for the presence of a protruding nanotube by using the force calibration mode to have the tip approach, contact, and retract from the surface. Nanotube protrusion was confirmed when elastic buckling was observed as a transient decrease in tip amplitude with no corresponding increase in tip deflection.
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20
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0141435456
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note
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To determine the height of a segment of DNA, the AFM image was first flattened to remove any tilt in the surface. A section profile was taken across the DNA segment of interest, and the height of the DNA relative to its surroundings was measured using software included with the AFM.
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21
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0026500201
-
-
Bustamante, C.; Vesenka, J.; Tang, C. L.; Rees, W.; Guthold, M.; Keller, R. Biochemistry 1992, 31, 22-26.
-
(1992)
Biochemistry
, vol.31
, pp. 22-26
-
-
Bustamante, C.1
Vesenka, J.2
Tang, C.L.3
Rees, W.4
Guthold, M.5
Keller, R.6
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