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Volumn 3, Issue 3, 2003, Pages 359-363

DNA-templated construction of copper nanowires

Author keywords

[No Author keywords available]

Indexed keywords

ASCORBIC ACID; CATION; COPPER; DNA; NITRIC OXIDE; SILICON;

EID: 0038582003     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl034016+     Document Type: Article
Times cited : (462)

References (21)
  • 11
    • 0003576507 scopus 로고    scopus 로고
    • Thin film deposition
    • Prentice Hall: Upper Saddle River, NJ
    • Plummer, J. D.; Deal, M. D.; Griffin, P. B. Thin Film Deposition. Silicon VLSI Technology; Prentice Hall: Upper Saddle River, NJ, 2000; pp 570-572.
    • (2000) Silicon VLSI Technology , pp. 570-572
    • Plummer, J.D.1    Deal, M.D.2    Griffin, P.B.3
  • 15
    • 0141658471 scopus 로고    scopus 로고
    • note
    • Images were obtained using a Multimode IIIa AFM and microfabricated Si cantilever tips (Digital Instruments, Santa Barbara, CA). Vibrational noise was reduced by using an active isolation system (MOD1-M, Halcyonics, Goettingen, Germany). During imaging, parameter settings were (i) resonant frequencies, 60-80 kHz; (ii) free oscillation amplitude, 0.5-1.0 V; (iii) setpoint, 0.3-0.7 V; and (iv) scan rate, 1.0-1.8 Hz.
  • 19
    • 0141770422 scopus 로고    scopus 로고
    • note
    • To affix a nanotube to an AFM tip, the tip was used to image a silicon surface on which single-walled carbon nanotubes had been grown as described in ref 16. The Si surface with nanotubes was kindly provided by Professor Charles Lieber's group at Harvard University. When the tip contacted a nanotube that was vertically oriented, the nanotube occasionally detached from the surface and associated with the tip, resulting in an apparent change in the height of the image. When this type of abrupt jump in height was detected, the tip was checked for the presence of a protruding nanotube by using the force calibration mode to have the tip approach, contact, and retract from the surface. Nanotube protrusion was confirmed when elastic buckling was observed as a transient decrease in tip amplitude with no corresponding increase in tip deflection.
  • 20
    • 0141435456 scopus 로고    scopus 로고
    • note
    • To determine the height of a segment of DNA, the AFM image was first flattened to remove any tilt in the surface. A section profile was taken across the DNA segment of interest, and the height of the DNA relative to its surroundings was measured using software included with the AFM.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.