Non-destructive optical analysis of band gap profile, crystalline phase, and grain size for Cu(In,Ga)Se2 solar cells deposited by 1-stage, 2-stage, and 3-stage co-evaporation

Progress in Photovoltaics: Research and Applications

Volumn 22, Issue 1, 2014, Pages 77-82

  Ranjan, Vikash ^a   Begou, Thomas ^a   Little, Scott ^b   Collins, Robert W ^b   Marsillac, Sylvain ^a  

^a Old Dominion University   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

Author keywords

characterization; Cu(In,Ga)Se2 (CIGS); ellipsometry; optical properties; thin film solar cells

Indexed keywords

BROADENING PARAMETERS; CRYSTALLINE PHASE; CU (IN ,GA)SE; NON DESTRUCTIVE; OPTICAL ANALYSIS; OPTICAL SIGNATURES; PROCESS VARIATION; THIN FILM SOLAR CELLS;

CHARACTERIZATION; ELLIPSOMETRY; ENERGY GAP; GALLIUM; GRAIN SIZE AND SHAPE; OPTICAL PROPERTIES; SOLAR CELLS; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84890569261     PISSN: 10627995     EISSN: 1099159X     Source Type: Journal    
DOI: 10.1002/pip.2350     Document Type: Article

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