Real time spectroscopic ellipsometry of CuInSe2: Growth dynamics, dielectric function, and its dependence on temperature

Physica Status Solidi - Rapid Research Letters

Volumn 5, Issue 7, 2011, Pages 217-219

  Begou, Thomas ^a   Walker, James D ^b   Attygalle, Dinesh ^b   Ranjan, Vikash ^a   Collins, R W ^b   Marsillac, Sylvain ^a  

^a Old Dominion University   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

Author keywords

CuInSe2; Dielectric function; Ellipsometry; Growth; Nucleation; Thin films

Indexed keywords

BROADENING PARAMETERS; COPPER INDIUM DISELENIDE; CRITICAL POINTS; CUINSE2; DIELECTRIC FUNCTIONS; GROWTH DYNAMICS; IN-SITU; NUCLEATION PROCESS; ON-LINE MATERIALS; REAL TIME SPECTROSCOPIC ELLIPSOMETRY;

COPPER COMPOUNDS; NUCLEATION; SELENIUM COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE ROUGHNESS;

DIELECTRIC MATERIALS;

EID: 79959977129     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.201105204     Document Type: Article

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