Growth and characterization of crystalline silica films on Pd(100)

Journal of Physical Chemistry C

Volumn 117, Issue 49, 2013, Pages 26144-26155

  Altman, Eric I ^a,b   Götzen, Jan ^a,b   Samudrala, Niveditha ^a,b   Schwarz, Udo D ^a,b  

^a YALE UNIVERSITY   (United States)

^b Yale University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATIONS; BULK CRYSTALLINE; CRYSTALLINE DOMAINS; CRYSTALLINE SILICA; LATTICE MATCHING; LONG RANGE ORDERS; SIX-MEMBERED RINGS; STEP-TERRACE STRUCTURE;

AUGER ELECTRON SPECTROSCOPY; CRYSTALLINE MATERIALS; ELECTRONS; EPITAXIAL GROWTH; FILM GROWTH; GEOMETRY; LOW ENERGY ELECTRON DIFFRACTION; SCANNING TUNNELING MICROSCOPY; SILICA;

SUBSTRATES;

EID: 84890527554     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp4101152     Document Type: Article

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