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Volumn , Issue , 2005, Pages 303-327

Scanning Nonlinear Dielectric Microscope

Author keywords

High order nonlinear dielectric microscopy; Nonlinear dielectric imaging; Nonlinear dielectric microscopy; Scanning nonlinear dielectric microscope; Three dimensional measurement technique

Indexed keywords


EID: 84889405718     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/3527604650.ch16     Document Type: Chapter
Times cited : (1)

References (23)
  • 1
    • 15844393769 scopus 로고
    • Denshi Joho Tsushin Gakkai Ronbunshi J78-C-1
    • [in Japanese]
    • Y. Cho, A. Kirihara, and T. Saeki, Denshi Joho Tsushin Gakkai Ronbunshi J78-C-1, 593 (1995) [in Japanese].
    • (1995) , vol.593
    • Cho, Y.1    Kirihara, A.2    Saeki, T.3
  • 2
    • 0030164519 scopus 로고    scopus 로고
    • Electronics and Communication in Japan
    • Part 2, 79, Scripta Technica, Inc
    • Y. Cho, A. Kirihara and T. Saeki, Electronics and Communication in Japan, Part 2, 79, Scripta Technica, Inc., 68 (1996).
    • (1996) , pp. 68
    • Cho, Y.1    Kirihara, A.2    Saeki, T.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.