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Volumn , Issue , 2005, Pages 303-327
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Scanning Nonlinear Dielectric Microscope
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Author keywords
High order nonlinear dielectric microscopy; Nonlinear dielectric imaging; Nonlinear dielectric microscopy; Scanning nonlinear dielectric microscope; Three dimensional measurement technique
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Indexed keywords
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EID: 84889405718
PISSN: None
EISSN: None
Source Type: Book
DOI: 10.1002/3527604650.ch16 Document Type: Chapter |
Times cited : (1)
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References (23)
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