Theory of scanning nonlinear dielectric microscopy and application to quantitative evaluation

Journal of the European Ceramic Society

Volumn 21, Issue 10-11, 2001, Pages 2135-2139

  Cho, Yasuo ^a   Ohara, Koya ^a   Kazuta, Satoshi ^a   Odagawa, Hiroyuki ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Dielectric properties; Ferroelectric properties; Scanning nonlinear dielectric microscopy; Tantalates

Indexed keywords

CAPACITANCE; CHEMICAL ANALYSIS; DIELECTRIC MATERIALS; ELECTRIC FIELDS; OPTICAL RESOLVING POWER; SENSITIVITY ANALYSIS;

SCANNING NONLINEAR DIELECTRIC MICROSCOPY (SNDM);

CERAMIC PRODUCTS;

CERAMICS;

EID: 0034883859     PISSN: 09552219     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0955-2219(01)00188-1     Document Type: Article

References (5)

1. Hisenkei yuudenritu bunpu you kenbikyou
2. Scanning nonlinear dielectric microscope
3. Scanning nonlinear dielectric microscopy with nanometer resolution
4. High spatial resolution quantitative microwave impedance microscopy by a scanning tip microwave near-field microscope
5. Dynamic measuring method of capacitance variation of piezoelectric ceramics with alternating electric Field