Surface-enhanced Raman scattering sensing on black silicon

Annalen der Physik

Volumn 525, Issue 12, 2013, Pages 907-914

  Gervinskas, Gediminas ^a   Seniutinas, Gediminas ^a   Hartley, Jennifer S ^a   Kandasamy, Sasikaran ^b   Stoddart, Paul R ^a   Fahim, Narges F ^a   Juodkazis, Saulius ^a  

^a SWINBURNE UNIVERSITY OF TECHNOLOGY   (Australia)

^b MELBOURNE CENTRE FOR NANOFABRICATION   (Australia)

Author keywords

Black silicon; DRIE; nano particles; SERS

Indexed keywords

BLACK-SILICON; DRIE; NUMERICAL APERTURE; PLASMA TREATMENT; SENSITIVITY INCREASE; SERS; SURFACE ENHANCED RAMAN SCATTERING (SERS); SURFACE REFLECTIONS;

BONE; COATINGS; DROPS; GOLD; GOLD COATINGS; NANOPARTICLES; PLASMA APPLICATIONS; RAMAN SCATTERING; REACTIVE ION ETCHING; SILICON; SILICON WAFERS; SOLUTIONS; SURFACE SCATTERING;

SUBSTRATES;

EID: 84889260562     PISSN: 00033804     EISSN: 15213889     Source Type: Journal    
DOI: 10.1002/andp.201300035     Document Type: Article

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