Optical interference effects in the design of substrates for surface-enhanced raman spectroscopy

Applied Spectroscopy

Volumn 63, Issue 2, 2009, Pages 133-140

  Shoute, Lian C T ^a,b   Bergren, Adam Johan ^a,b   Mahmoud, Amr M ^a,b   Harris, Ken D ^a,b   McCreery, Richard L ^a,b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Interference; Raman spectroscopy; SERS; Silver island films; Surface enhanced raman spectroscopy

Indexed keywords

AG PARTICLES; DIELECTRIC LAYERS; ENHANCEMENT FACTORS; EXPERIMENTAL SET-UP; INCIDENT LIGHTS; INTERFERENCE; INTERLAYER THICKNESS; MEAN SQUARES; MORPHOLOGICAL VARIATIONS; NANO-STRUCTURED; NATIVE OXIDES; NITROAZOBENZENE; OPTICAL INTERFERENCE EFFECTS; OXIDE THICKNESS; RAMAN INTENSITIES; RAMAN SIGNALS; SERS; SI SUBSTRATES; SILVER FILMS; SILVER ISLAND FILMS; SILVER LAYERS; STANDING WAVES; SURFACE-ENHANCED RAMAN SPECTROSCOPY; THERMAL OXIDE LAYERS; THERMALLY OXIDIZED SILICONS;

CHEMISORPTION; ELECTRIC FIELDS; FIBER OPTIC SENSORS; LIGHT INTERFERENCE; METALLIC FILMS; OXIDE FILMS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SILICON COMPOUNDS; SILICON WAFERS; SPECTRUM ANALYSIS; SUBSTRATES; SURFACES; VACUUM DEPOSITION;

SILVER;

EID: 61349176012     PISSN: 00037028     EISSN: None     Source Type: Journal    
DOI: 10.1366/000370209787392102     Document Type: Article

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