Instrument response of reflection high energy electron diffraction pole figure

Applied Surface Science

Volumn 288, Issue , 2014, Pages 458-465

  Chen, L ^a   Dash, J ^a   Su, P ^a   Lin, C F ^a   Bhat, I ^a   Lu, T M ^a   Wang, G C ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

Epitaxial CdTe film; Instrument response of transmitted electrons; Reflection high energy electron diffraction; RHEED pole figure; Textured CdTe film

Indexed keywords

CADMIUM TELLURIDE; DISPERSIONS; ELECTRONS; EPITAXIAL GROWTH; GALLIUM ARSENIDE; II-VI SEMICONDUCTORS; III-V SEMICONDUCTORS; IMAGE PROCESSING; POLES; THIN FILMS;

CDTE; IN-PLANE DISPERSIONS; INSTRUMENT RESPONSE FUNCTIONS; MEAN FREE PATH OF ELECTRONS; NANOSTRUCTURED FILMS; POLE FIGURE; POLE FIGURE MEASUREMENTS; QUANTITATIVE EVALUATION;

REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;

EID: 84888434881     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2013.10.055     Document Type: Article

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