In situ thin-film texture determination

Journal of Applied Physics

Volumn 85, Issue 4, 1999, Pages 2151-2156

  Litvinov, Dmitri ^a   O'Donnell, Thomas ^a   Clarke, Roy ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000265796     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.369519     Document Type: Article

References (8)

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