Fast mapping of absorbing defects in optical materials by full-field photothermal reflectance microscopy

Optics Letters

Volumn 38, Issue 22, 2013, Pages 4907-4910

  Choi, Woo June ^a   Ryu, Seon Young ^a   Kim, Jun Ki ^a   Kim, Jae Young ^a   Kim, Dong Uk ^a   Chang, Ki Soo ^a  

^a Korea Basic Science Institute (KBSI)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECT MAPPING; DEFECT SITES; DETECTIVITY; INTENSITY-MODULATED; LASER-INDUCED DAMAGE; PHOTOTHERMAL DEFLECTIONS; PHOTOTHERMAL REFLECTANCE MICROSCOPIES; PROBE BEAM;

MAPPING; OPTICAL MATERIALS; REFLECTION; REFRACTIVE INDEX;

DEFECTS;

EID: 84887881011     PISSN: 01469592     EISSN: 15394794     Source Type: Journal    
DOI: 10.1364/OL.38.004907     Document Type: Article

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